Subgap conductivity in SIN-junctions of high barrier transparency

We investigate the current-voltage characteristics of high-transparency superconductor-insulator-normal metal (SIN) junctions with the specific tunnel resistance below 30 kOhm per square micron. The junctions were fabricated from different superconducting and normal conducting materials, including Nb, Al, AuPd and Cu. The subgap leakage currents were found to be appreciably larger than those given by the standard tunnelling model. We explain our results using the model of two-electron tunnelling in the coherent diffusive transport regime. We demonstrate that even in the high-transparency SIN-junctions, a noticeable reduction of the subgap current can be achieved by splitting a junction into several submicron sub-junctions. These structures can be used as nonlinear low-noise shunts in Rapid-Single-Flux-Quantum (RSFQ) circuitry for controlling Josephson qubits.Comment: 6 pages, 5 figures, 1 tabl

Measurement of coherent charge transfer in an adiabatic Cooper pair pump

We study adiabatic charge transfer in a superconducting Cooper pair pump, focusing on the influence of current measurement on coherence. We investigate the limit where the Josephson coupling energy $E_J$ between the various parts of the system is small compared to the Coulomb charging energy $E_C$. In this case the charge transferred in a pumping cycle $Q_P \sim 2e$, the charge of one Cooper pair: the main contribution is due to incoherent Cooper pair tunneling. We are particularly interested in the quantum correction to $Q_P$, which is due to coherent tunneling of pairs across the pump and which depends on the superconducting phase difference $\phi_0$ between the electrodes: $1-Q_P/(2e) \sim (E_J/E_C) \cos \phi_0$. A measurement of $Q_P$ tends to destroy the phase coherence. We first study an arbitrary measuring circuit and then specific examples and show that coherent Cooper pair transfer can in principle be detected using an inductively shunted ammeter

Einzelelektronentunneln: Mehrlagentechnologie fuer metallische Nanostrukturen

SIGLEAvailable from TIB Hannover: RN 3295(70) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung und Forschung (BMBF), Bonn (Germany)DEGerman